| 检测对象 | Reliability Test | Test Std. | Test Conditions |
| 可靠性试验项目 | 试验标准 | 试验条件 | |
| 功率半导体器件 | 温度循环 TC (Temperature Cycle) | JESD22-A104 | Condition B:-40℃~125℃/-55℃~125℃,1000 cycles, C-SAM at 100cycle interval |
| 低温存储试验LT (Low Temperature Storage CONFIDENTIAL Life) | JESD22-A11 | Storage temp.:-55±5℃ Test Duration:1000 hours | |
| 高温存储试验 HTS (High Temperature Storage) | GB/T 4937-1995 第Ⅲ篇 2 GB/T 2424.19-2005 JESD22-A103C | Temperature: 125/150/175°C Test Duration:168/500/ 1000hours | |
| 稳态湿热试验 STH Steady-State Temperature Humidity Bias Life Test | JESD22-A101C 5 | Temperature: 85°C Humidity:85%RH Test Duration: 1000hours | |
| 高温高湿偏压 H3TRB (High Humidity, High Temperature Reverse Bias)THB | AEC -Q101 JESD22A-101 | Temperature: 85°C Humidity:85%RH Bias:3000V Test Duration: 1000hours | |
| 高温反偏HTRB (High Temperature Reverse Bias) | JESD22-A108 | Ta = 125˚C/150˚C, Bias:3000V Test Duration: 1000hours | |
| 高温栅反偏试验HTGB (High Temperature Gate Bias) | JESD22A-108 AEC-Q101 | 1000 hours at Ta = 150˚C, with gate biased to 100% of max gate voltage rating with device biased OFF | |
| 间歇工作寿命IOL (Intermittent Operational Life) | JESD22-A122 | 6,000 Cycles, devices powered to insure Δ Ta ≥ (2min on and 2min off). | |
| 高压加速寿命试验PCT (High Pressure Accelerated Life Test) | JESD22-A11 | Ta=121˚C /100%RH Test Duration: 96hours | |
| 高加速老化试验 HAST(Highly Accelerated Stress Test) | JESD22-A110 | Ta =130℃, 85% RH, 230Kpa, Vds=80%Spec(42V max) Test Duration: 96hours | |
| 不偏压高速老化 UHAST (Unbiased Temperature/Humidity) | JESD22-A110 | Ta =130℃, 85% RH, Test Duration: 96hours | |
| 盐雾腐蚀试验 SST（Salt fog corrosion test） | GBT2423.17-93 | Salt solution：35±2℃ PH=6.5~7.2 Test Duration: 96hours； CASS test：49±℃ PH=3.0~3.1 Test Duration: 48 hours |